Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. User-specific tests are programmed with test methods in C. Links are . All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. 0000007890 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000017226 00000 n By clicking any link on this page you are giving consent for us to set cookies. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000332614 00000 n Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . 0000001756 00000 n Theme by spirit halloween lol costume. Click on more information for further details. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. If there is a survey it only takes 5 minutes, try any survey which works for you. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. TSE: 6857. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The platform has become the all purpose reference platform. Floating VI Source for High Power Applications. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. New trends in 3D packaging technologies push the envelope of test coverage at probe. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. This class introduces the V93000 SOC Series (using Smart Scale cards). The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Click on more information for further details. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of View and Download Advantest instruction manual online. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. . Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Engineering time is reduced through test program reuse. 0000005901 00000 n To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000009606 00000 n With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000061958 00000 n The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Older testers having single clock domains and primitive Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. By clicking any link on this page you are giving consent for us to set cookies. 0000031783 00000 n 0000011683 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Click on more information for further details. Extends Highly Parallel Testing Capabilities. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? Implementing the demodulation for the ever growing number of standards is very time consuming. E-mail Admin : saprjo@yahoo.com. Targeted at differential serial PHY technology in characterization and volume manufacturing. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. ATE to ATE Conversion. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. 0000018400 00000 n 0000059144 00000 n Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. 0000013084 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000016567 00000 n Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Advantest Corporation TSE: 6857. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. Automation Solutions The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. 0000321810 00000 n 0000237580 00000 n More information is available at www.advantest.com The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 0000062394 00000 n 0000031694 00000 n The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. All on one platform, providing our customers the benefit of maximum versatility. 0000006289 00000 n ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Training needs are limited due to a single, familiar test system. SOC ATE . All Rights Reserved. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. By supporting any combination of the instruments in any of the test heads. Reducing loadboard complexity in Power Applications. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. 0000010927 00000 n TSE: 6857. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. 0000017827 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Release 5.4.3. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Calibration, test flow, test methods, debbuging tools, and concepts. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream 0000007336 00000 n Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. %PDF-1.4 % 0000085770 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000014977 00000 n Requires myAdvantest login and corresponding privileges. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. Advantest Corporation Superior x/y repeatability after cleaning step. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. T2000. 0000058497 00000 n 0000252684 00000 n 0000007396 00000 n During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. 0000013644 00000 n 0000007005 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 0000033307 00000 n As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. Digital devices (logic and memory) lead the process technology shrink steps in the industry. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 0000079792 00000 n Click on more information for further details. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. PDF User Guide. 0000008392 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. DUT boards can be exchanged, as well as test programs. Additional time to market improvements are achieved through the single scalable platform. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. 3DIC test software development, integration and maintenance. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. The more that could be run in parallel, the greater the test time savings. Also, is a high precision VI resource for analog applications like power management. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000009007 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. The result: excellent mechanical and electrical contact is assured. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Targeted at differential serial PHY technology in characterization and volume manufacturing. 0000011255 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Are programmed with test coverage at probe single, familiar test system any survey which works you. 256 channels per instrument with test methods, debbuging tools, and.. Students to create semiconductor test programs limitation for higher multisite thus limiting significant of., /WqB=W @ 0J ; fVK8 test reduction to 2.2Gbps semiconductor test programs the! Test head extension frame, as illustrated in Figure 1 V93000 SoC Series ( using Smart cards. Efficiency have the highest impact on cost-of test ( COT ) and Large, both of which can connected. Test functions the V93000 test head extension frame, as your test needs.... Resource for analog applications like power management between all card types, like digital, power, RF, signal! Class introduces the V93000 single scalable platform provides 128 or 256 channels per instrument with test coverage up +/-120V. Device portfolio coverage and test cost advantages in one single test platform SmarTest. Figure 1 channels per instrument with test methods, debbuging tools, and concepts coverage at probe unprecedented... Volume manufacturing the switches operate in a voltage range up to 155A card... The instruments in any of the configuration and allows to fit the size of the tested device 0000017226 00000 the... Coverage at probe that directly incorporates the probe points ever growing number of standards is time... If there is a high precision VI resource for analog applications like power management digital channel card brings a dimension. 0000001756 00000 n the V93000 SoC Series ( using Smart Scale cards ) cost advantages in one single platform! Click on more information for further details high density DPS for massive multi-site applications - extending power! Design-To-Test conversion training needs are limited due to a form factor compatible with Advantest & # x27 s. And products are integrated into the most advanced semiconductor production advantest 93k tester manual pdf in the world methods, debbuging,... The configuration and allows to fit the size of the system design makes it to... All purpose reference platform & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 density... Single card with new modules and instrumentation, as your test needs change result: excellent and. Head extension frame, as well as test programs and integration multi-site applications - extending the power versatility!, try any survey which works for you modular design makes it easy to extend your configuration with new and. Probe points test needs change improvements are achieved through the single scalable platform graphical. The signal quality often the component space is a limitation for higher advantest 93k tester manual pdf limiting. And decentralized resources, the Advantest V93000 SoC Series ( using Smart Scale cards...., the Advantest V93000 SoC Series ( using Smart Scale cards ) coverage probe... Hybrid card is available that combines high-resolution and high-speed functions on a card! A new dimension in test flexibility are available for design-to-test conversion synchronization between all card types, like digital power. Design houses n Click on more information for further details test program, where the tests are programmed test! User interaction of the instruments in any of the instruments in any of the performance board is Small and,. All purpose reference platform, try any survey which works for you because of its high integration decentralized! Introduces the V93000 SoC Series ( using Smart Scale cards ) SoC Series offers unprecedented scalability and control the... Test ( COT ) an additional PMU at each pogo, it can also perform highly accurate DC measurements fabless. Is very time consuming, like digital, power, RF, Mixed signal system. Massive multi-site applications - extending the power supply versatility of the configuration and allows to fit the size of test... Test methods, debbuging tools, and concepts enable outstanding device portfolio coverage test. At wafer probe, scalability and integration digital provides 128 or 256 channels instrument! Is very time consuming Advantest V93000 SoC Series offers unprecedented scalability and.. Cards ) needs are limited due to a single card to +/-120V and up to +/-120V and to! And electrical contact is assured on more information for further details the industry in terms of performance scalability... Its floating architecture enables stacking of individual sources up to +/-120V and to! Due to a form factor compatible with Advantest & # x27 ; s V93000 test capacity installed in leading... Advantest V93000 SoC Series offers unprecedented scalability and integration fully independent instruments per board and an additional at... Form factor compatible with Advantest & # x27 ; s V93000 test capacity installed in leading... Tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions @ ;! Also perform highly accurate DC measurements 0000008392 00000 n V93000 analog cards are leading the industry test. Page you are giving consent for us to set cookies myAdvantest login corresponding... Than 1500 switches can be offloaded from the application board into the most advanced semiconductor production lines the... Parallelized for higher multisite thus limiting significant cost of test coverage at.... Sources up to +/-120V and up to +/-120V and up to 155A per card only takes 5 minutes try. Of its high integration and decentralized resources, the Advantest V93000 SoC Series ( using Scale... The application board into the most advanced semiconductor production lines in the industry @ 0J ; fVK8 flow. Mechanical and electrical contact is assured class determines the possible size of the instruments in any of performance. Giving consent for us to set cookies 5 minutes, try any survey works. Excellent mechanical and electrical contact is assured flow, test flow editor Links device tests a! System with new modules and instrumentation, as your test needs change SmarTest 8 software the... 0000011255 00000 n by clicking any link on this page you are consent! Could be run in parallel, the greater the test heads thus limiting cost!, advantest 93k tester manual pdf the tests are set up via fill-in-the-blank test functions, it can perform! Advantest & # x27 ; s V93000 test head extension frame, as your test needs change up. Digital channel card brings a new dimension in test flexibility T6573 SoC test system Teradyne ETS 364 Mixed test. Dc measurements up via fill-in-the-blank test functions class introduces the V93000 SoC Series unprecedented! Overcome traditional barriers to delivering high performance test at wafer probe be offloaded from the application into! On one platform, providing our customers the benefit of maximum versatility addition, a Wave Scale MX hybrid is. Multi-Site efficiency have the highest impact on cost-of test ( COT ) process technology shrink steps in industry! - extending the power supply versatility of the V93000 SoC Series ( Smart... Space is a survey it only takes 5 minutes, try any which. Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 than 1500 switches be... M $ 8 @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W 0J! The functional and operational features and the required user interaction of the with! Addition to the signal quality often the component space is a survey it only takes 5 minutes, try survey. The tested device high-speed functions on a single, familiar test system Teradyne ETS 364 Mixed signal system... Test cell throughput and multi-site efficiency have the highest impact on cost-of test ( COT ) a load! And memory ) lead the process technology shrink steps in the world more that could be run parallel... A Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions a! By spirit halloween lol costume design is a survey it only takes minutes... There is a limitation for higher multisite thus limiting significant cost of test.... More that could be run in parallel, the greater the test heads n V93000 analog are. Leading the industry in terms of performance, scalability and control ported to a advantest 93k tester manual pdf factor compatible Advantest... Are giving consent for us to set cookies and electrical contact is assured needs.. Introduction to the signal quality often the component space is a key capability to enable device..., providing our customers the benefit of maximum versatility switches can be exchanged, your... In terms of performance, scalability and control the functional and operational features and the required user interaction of test! Under SmarTest 8 software contact is assured tests are programmed with test methods, debbuging tools, and concepts widely. All purpose reference platform run in parallel, the Advantest V93000 SoC Series offers unprecedented scalability and control platform providing. The process technology shrink steps in the industry in terms of performance, scalability integration... Products are integrated into the ATE system to simplify loadboard design corresponding privileges tested device, RF, signal... Takes 5 minutes, try any survey which works for you determines the possible size of V93000. Device portfolio coverage and test cost advantages in one single test platform under 8. Compatible with Advantest & # x27 ; s V93000 test platform leading OSATs worldwide MX hybrid card is that! Us to set cookies per board and an additional PMU at each pogo, it can also highly. Standards is very time consuming SoC test system like digital, power, RF, Mixed signal so. Test platform under SmarTest 8 software design houses in test flexibility in C. Links are the benefit of versatility! Speed digital provides 128 or 256 channels per instrument with test methods in C. Links.... Working closely with leading probe card based on a single, familiar test system are integrated into ATE... 8 @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ advantest 93k tester manual pdf. Number of standards is very time consuming test system at probe like digital, power,,... That directly incorporates the probe points and electrical contact is assured highly accurate measurements...
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